19.12.2017

Advanced transmission electron microscopy for materials research

This course covers advanced TEM techniques, such as electron energy loss spectroscopy (EELS) and energy dispersive X-ray spectroscopy, scanning transmission electron microscopy (STEM), and HRTEM imaging mechanism, some basics on spherical aberration correction technique, and recent developments related to these techniques, such as such as atomic resolution EELS and EDS maps for imaging individual atoms etc.

The principles and theories related to these techniques will be physically explained in detail from the viewpoint of electron wave and particles behavior in the microscope. Importantly, how to apply these advanced techniques to solve materials problems will be demonstrated. It will also include a short portion of practical courses, demonstrating how to acquire useful and reliable data from specific materials.

Vortragende/r: 
Z. Zhang

MUonline: 
Link